|
|
|
|
|
|
| XStatic™ TLP Measurements |
| The TLP test and the two associated leakage tests (pre- and post- transient) have been integrated into an automated measurement system. Six test samples, consisting of an array of assorted PCB geometries and XStatic™ formulations are incorporated into a 4 inch by 4 inch square PCB and can be tested at one time. Measurement data from these samples are downloaded into an SQL database for further statistical analysis. The automated tester serves the needs of both the material development research group and manufacturing process control. |
| |
|
|
| |
| The response of a representative PCB anti-pad structure, filled with a typical XStatic™ formulation, to a 900 Volt TLP pulse is shown here. The TLP is set to an open circuit voltage of 900 Volts. The XStatic™ material behaves like a dielectric until the TLP voltage rises above the trigger voltage (in this example, 375 Volts), at which time it becomes conductive and clamps (limits) the transient amplitude to 200 volts. At the completion of the TLP pulse, the XStatic™ material automatically reverts back to a dielectric state. |
| |
 |
| |
| The leakage currents are all well below 1 nanoampere for applied DC voltages less than 60 volts: |
| |
 |
|
|
|
|
|
|
|
